Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in todays technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholdersfrom graduate students to scholars to industry professionalshave numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.
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